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  • Blunt Probe of IEC 60950 Figure 2C Test Probe

    Blunt Probe meets IEC60950 Figure 2C, IEC 62368 Figure V.3 and UL6500 Figure B.1 standards. Is for the absolute share TNV circuits information technology to see if they provide sufficient protection.

  • UL 60950-1 / IEC 62368 Wedge Probe

    This Probe is used for testing access to document shredders. The Wedge Probe is a high precision probe made in exact accordance with UL and IEC standards such as UL60950 Figure EE.1 and EE.2, IEC 623

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